Study of photoemission spectroscopy with polarized x-rays

Ping S. Shaw, Shaul Hanany, Yee Liu, Robert Novick, Andrea E. Santangelo, Giuseppe Manzo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Several recent experiments were conducted to study the x-ray induced photoemission from solids by polarized x rays for its potential application to stellar x-ray polarimetry. However, it was shown recently that the earlier observed polarization dependence of the secondary photoelectron yield was affected by spurious effects and no polarization dependence could be observed after these spurious effects had been eliminated. Here, we report our first measurement of the primary photoelectrons, i.e., photoelectrons with energy higher than 50 eV. We measured the primary photoelectron yield of a silicon sample as a function of the polarization state of the incident 2.69 keV x-ray beam. We observed that the change of photoelectron yield for different polarization states is especially pronounced around the no-loss photoelectron peaks. This polarization dependency can be explained by the angular distribution of photoelectrons from free atoms excited by polarized x rays. We discuss the experimental results and their implications.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages119-127
Number of pages9
ISBN (Print)081941607X
StatePublished - Dec 1 1994
EventX-Ray and Ultraviolet Spectroscopy and Polarimetry - San Diego, CA, USA
Duration: Jul 28 1994Jul 29 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2283
ISSN (Print)0277-786X

Other

OtherX-Ray and Ultraviolet Spectroscopy and Polarimetry
CitySan Diego, CA, USA
Period7/28/947/29/94

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