TY - GEN
T1 - Study of photoemission spectroscopy with polarized x-rays
AU - Shaw, Ping S.
AU - Hanany, Shaul
AU - Liu, Yee
AU - Novick, Robert
AU - Santangelo, Andrea E.
AU - Manzo, Giuseppe
PY - 1994/12/1
Y1 - 1994/12/1
N2 - Several recent experiments were conducted to study the x-ray induced photoemission from solids by polarized x rays for its potential application to stellar x-ray polarimetry. However, it was shown recently that the earlier observed polarization dependence of the secondary photoelectron yield was affected by spurious effects and no polarization dependence could be observed after these spurious effects had been eliminated. Here, we report our first measurement of the primary photoelectrons, i.e., photoelectrons with energy higher than 50 eV. We measured the primary photoelectron yield of a silicon sample as a function of the polarization state of the incident 2.69 keV x-ray beam. We observed that the change of photoelectron yield for different polarization states is especially pronounced around the no-loss photoelectron peaks. This polarization dependency can be explained by the angular distribution of photoelectrons from free atoms excited by polarized x rays. We discuss the experimental results and their implications.
AB - Several recent experiments were conducted to study the x-ray induced photoemission from solids by polarized x rays for its potential application to stellar x-ray polarimetry. However, it was shown recently that the earlier observed polarization dependence of the secondary photoelectron yield was affected by spurious effects and no polarization dependence could be observed after these spurious effects had been eliminated. Here, we report our first measurement of the primary photoelectrons, i.e., photoelectrons with energy higher than 50 eV. We measured the primary photoelectron yield of a silicon sample as a function of the polarization state of the incident 2.69 keV x-ray beam. We observed that the change of photoelectron yield for different polarization states is especially pronounced around the no-loss photoelectron peaks. This polarization dependency can be explained by the angular distribution of photoelectrons from free atoms excited by polarized x rays. We discuss the experimental results and their implications.
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M3 - Conference contribution
AN - SCOPUS:0028747137
SN - 081941607X
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 119
EP - 127
BT - Proceedings of SPIE - The International Society for Optical Engineering
PB - Society of Photo-Optical Instrumentation Engineers
T2 - X-Ray and Ultraviolet Spectroscopy and Polarimetry
Y2 - 28 July 1994 through 29 July 1994
ER -