Studies of phase segregation in Cd1-xZnxTe using surface photovoltage spectroscopy

Y. Zidon, Jihua Yang, Yoram Shapira

Research output: Contribution to journalArticlepeer-review

7 Scopus citations


Cd1-xZnxTe wafers used for x-ray detector arrays have been failure analyzed using x-ray diffraction, x-ray electron spectroscopy (XPS), energy dispersive spectroscopy (EDS), and surface photovoltage spectroscopy (SPS). The last shows ZnTe segregation in failed pixels while the precipitant phase is too small to be observed by the other techniques. The Zn concentration, measured using EDS and XPS, was higher than that deduced from SPS data, confirming the conclusion. The segregation can be revealed only by SPS since it is sensitive to the electronic structure and thus to x in each phase while the other techniques average x over their measurement volume.

Original languageEnglish (US)
Pages (from-to)436-438
Number of pages3
JournalApplied Physics Letters
Issue number3
StatePublished - Jul 15 2002
Externally publishedYes


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