Structural and magnetic properties of perpendicular FePt thin films with inserted Ag layer

Y. Z. Zhou; J. S. Chen; G. M. Chow; J. P. Wang

doi:10.1063/1.1669327

Structural and magnetic properties of perpendicular FePt thin films with inserted Ag layer

Y. Z. Zhou, J. S. Chen, G. M. Chow, J. P. Wang

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

The inserted Ag layer between FePt layers increased the coercivity in perpendicular 10-nm-thick FePt film. The x-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques were used for investigating the deposited films. With increasing Ag thickness, the out-of-plane coercivity increased, from 2.0 kOe, for the sample without Ag, to 4.4 kOe, for the sample with 3 nm Ag. Silver insertion also affected the magnetic reversal mode in these films and reduced the magnetic grain size.

Original language	English (US)
Pages (from-to)	7495-7497
Number of pages	3
Journal	Journal of Applied Physics
Volume	95
Issue number	11 II
DOIs	https://doi.org/10.1063/1.1669327
State	Published - Jun 1 2004

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10.1063/1.1669327

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abstract = "The inserted Ag layer between FePt layers increased the coercivity in perpendicular 10-nm-thick FePt film. The x-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques were used for investigating the deposited films. With increasing Ag thickness, the out-of-plane coercivity increased, from 2.0 kOe, for the sample without Ag, to 4.4 kOe, for the sample with 3 nm Ag. Silver insertion also affected the magnetic reversal mode in these films and reduced the magnetic grain size.",

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T1 - Structural and magnetic properties of perpendicular FePt thin films with inserted Ag layer

AU - Zhou, Y. Z.

AU - Chen, J. S.

AU - Chow, G. M.

AU - Wang, J. P.

PY - 2004/6/1

Y1 - 2004/6/1

N2 - The inserted Ag layer between FePt layers increased the coercivity in perpendicular 10-nm-thick FePt film. The x-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques were used for investigating the deposited films. With increasing Ag thickness, the out-of-plane coercivity increased, from 2.0 kOe, for the sample without Ag, to 4.4 kOe, for the sample with 3 nm Ag. Silver insertion also affected the magnetic reversal mode in these films and reduced the magnetic grain size.

AB - The inserted Ag layer between FePt layers increased the coercivity in perpendicular 10-nm-thick FePt film. The x-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques were used for investigating the deposited films. With increasing Ag thickness, the out-of-plane coercivity increased, from 2.0 kOe, for the sample without Ag, to 4.4 kOe, for the sample with 3 nm Ag. Silver insertion also affected the magnetic reversal mode in these films and reduced the magnetic grain size.

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JF - Journal of Applied Physics

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IS - 11 II

ER -

Structural and magnetic properties of perpendicular FePt thin films with inserted Ag layer

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