Structural and dielectric properties of Ba0.5Sr0.5TiO3thin films with an EPI-RuO2 bottom electrode

Q. X. Jia, A. T. Findikoglu, R. Zhou, S. R. Foltyn, X. D. Wu, J. L. Smith, Q. Wang, D. F. Evans, W. L. Gladfelter

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Engineering

Material Science