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Stress effects in p-type AIGaN/GaN heterostructures
Agustinus Sutandi
, P P Ruden
, Kevin F. Brennan
Electrical and Computer Engineering
Research output
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Chapter in Book/Report/Conference proceeding
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Conference contribution
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Keyphrases
Stress Effect
100%
Polarization Charge
100%
AIGaN
100%
AlGaN/GaN Heterostructure
100%
Stress-induced
50%
Band Gap
50%
Interfacial Polarization
50%
Valence Band
50%
Wurtzite Structure
50%
Linear Elastic
50%
Sapphire Substrate
50%
P-channel
50%
Piezoresistive
50%
Valence Band Structure
50%
Sheka
50%
Surface Defect States
50%
Band Energy
50%
III-nitride Heterostructures
50%
III-nitride Materials
50%
Elastic Theory
50%
Rashba
50%
Six-band
50%
Deformation Potential
50%
Bulk Defects
50%
Piezooptic Effect
50%
Uniaxial
50%
Expected Effect
50%
Interface Defect States
50%
Channel Region
50%
Lattice Polarizations
50%
Physics
Nitride
100%
Physics
50%
Optics
50%
Piezoelectricity
50%
Energy Band
50%
Wurtzite
50%
Material Science
Heterojunction
100%
Piezoelectricity
33%
Sapphire
33%
Nitride Compound
33%
Materials Class
33%
III Nitride Materials
33%