STRATEGY FOR TESTING VHSIC CHIPS.

R. R. Ramseyer, D. T. Lee, L. L. Kinney

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@article{d84484efba9e46699e5d7d4d94207e24,

title = "STRATEGY FOR TESTING VHSIC CHIPS.",

author = "Ramseyer, {R. R.} and Lee, {D. T.} and Kinney, {L. L.}",

year = "1982",

month = dec,

day = "1",

language = "English (US)",

pages = "515--518",

journal = "AUTOTESTCON (Proceedings)",

issn = "0734-7510",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - STRATEGY FOR TESTING VHSIC CHIPS.

AU - Ramseyer, R. R.

AU - Lee, D. T.

AU - Kinney, L. L.

PY - 1982/12/1

Y1 - 1982/12/1

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M3 - Article

AN - SCOPUS:0020289975

SN - 0734-7510

SP - 515

EP - 518

JO - AUTOTESTCON (Proceedings)

JF - AUTOTESTCON (Proceedings)

ER -