Strain-Engineered MoTe2 Photodetector in Silicon Photonics at 1550 nm

  • R. Maiti
  • , C. Patil
  • , T. Xie
  • , J. G. Azadani
  • , R. Amin
  • , M. Miscuglio
  • , D. Van Thourhout
  • , T. Low
  • , S. Bank
  • , V. J. Sorger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Here we show how strain-engineering (∼4% tensile strain) lowers the bandgap (-0.2eV) of MoTe2 nanocrystals heterogeneously integrated around a silicon photonic waveguide, thus enabling photoabsorption at 1550nm, a responsivity of 0.5A/W and NEP of 90pW/Hz2.

Original languageEnglish (US)
Title of host publication2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings
Subtitle of host publicationScience and Innovations, CLEO_SI 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580767
DOIs
StatePublished - May 2020
Event2020 Conference on Lasers and Electro-Optics, CLEO 2020 - San Jose, United States
Duration: May 10 2020May 15 2020

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2020-May
ISSN (Print)1092-8081

Conference

Conference2020 Conference on Lasers and Electro-Optics, CLEO 2020
Country/TerritoryUnited States
CitySan Jose
Period5/10/205/15/20

Bibliographical note

Publisher Copyright:
© 2020 OSA.

Fingerprint

Dive into the research topics of 'Strain-Engineered MoTe2 Photodetector in Silicon Photonics at 1550 nm'. Together they form a unique fingerprint.

Cite this