Stochastic coupled oscillator model of EEG for Alzheimer's disease

P. Ghorbanian, S. Ramakrishnan, H. Ashrafiuon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Coupled nonlinear oscillator models of EEG signals during resting eyes-closed and eyes-open conditions are presented based on Duffing-van der Pol oscillator dynamics. The frequency and information entropy contents of the output of the nonlinear model and the actual EEG signal is matched through an optimization algorithm. The framework is used to model and compare EEG signals recorded from Alzheimer's disease (AD) patients and age-matched healthy controls (CTL) subjects. The results show that 1) the generated model signal can capture the frequency and information entropy contents of the EEG signal with very similar power spectral distribution and non-periodic time history; 2) the EEG and the generated signal from the eyes-closed model are α band dominant for CTL subjects and θ band dominant for AD patients; and 3) statistically distinct models represent the EEG signals from AD patients and CTL subject during resting eyes-closed condition.

Original languageEnglish (US)
Title of host publication2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages706-709
Number of pages4
ISBN (Electronic)9781424479290
DOIs
StatePublished - Nov 2 2014
Event2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 - Chicago, United States
Duration: Aug 26 2014Aug 30 2014

Publication series

Name2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014

Other

Other2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014
Country/TerritoryUnited States
CityChicago
Period8/26/148/30/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

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