STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network

Hwanhui Yun; Abhinav Prakash; Bharat Jalan; Jong Seok Jeong; K. Andre Mkhoyan

doi:10.1016/j.ultramic.2019.112863

STEM beam channeling in BaSnO₃/LaAlO₃ perovskite bilayers and visualization of 2D misfit dislocation network

Hwanhui Yun, Abhinav Prakash, Bharat Jalan, Jong Seok Jeong, K. Andre Mkhoyan

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

A study of the STEM probe channeling in a heterostructured crystalline bilayer specimens is presented here with a goal to guide STEM-based characterization of multilayer structures. STEM analysis of perovskite BaSnO₃/LaAlO₃ bilayers is performed and the dominating effects of beam channeling on HAADF- and LAADF-STEM are illustrated. To study the electron beam channeling through BaSnO₃/LaAlO₃ bilayers, probe intensity depth profiles are calculated, and the effects of probe defocus and atomic column alignment are discussed. Characteristics of the beam channeling are correlated to resulting ADF-STEM images, which is then tested by comparing focal series of plan-view HAADF-STEM images to those recorded experimentally. Additionally, discussions on how to visualize the misfit dislocation network at the BaSnO₃/LaAlO₃ interface using HAADF- and LAADF-STEM images are provided.

Original language	English (US)
Article number	112863
Journal	Ultramicroscopy
Volume	208
DOIs	https://doi.org/10.1016/j.ultramic.2019.112863
State	Published - Jan 2020

Bibliographical note

Funding Information:
This work is supported in part by SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by University of Minnesota (UMN) MRSEC program under award no. DMR-1420013. This work utilized the College of Science and Engineering (CSE) Characterization Facility, UMN, supported in part by the NSF through the UMN MRSEC program. Thin film growth work was supported by the National Science Foundation through DMR-1741801, UMN MRSEC program under award no. DMR-1420013 and through the Young Investigator Program of the Air Force Office of Scientific Research (AFOSR) through grant no. FA9550-16- 1-0205. H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea.

Funding Information:
This work is supported in part by SMART , one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by University of Minnesota (UMN) MRSEC program under award no. DMR-1420013 . This work utilized the College of Science and Engineering (CSE) Characterization Facility, UMN, supported in part by the NSF through the UMN MRSEC program. Thin film growth work was supported by the National Science Foundation through DMR- 1741801 , UMN MRSEC program under award no. DMR-1420013 and through the Young Investigator Program of the Air Force Office of Scientific Research (AFOSR) through grant no. FA9550-16- 1-0205 . H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea.

Publisher Copyright:
© 2019 Elsevier B.V.

Keywords

BaSnO
Channeling
Focal series
HAADF
Heterostructure
LAADF
LaAlO
Multislice
STEM

MRSEC Support

Partial

PubMed: MeSH publication types

Journal Article

Publisher link

10.1016/j.ultramic.2019.112863

Find It

Find It at U of M Libraries

Cite this

@article{4c359fa7a99547c382076d994f7ef836,

title = "STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network",

abstract = "A study of the STEM probe channeling in a heterostructured crystalline bilayer specimens is presented here with a goal to guide STEM-based characterization of multilayer structures. STEM analysis of perovskite BaSnO3/LaAlO3 bilayers is performed and the dominating effects of beam channeling on HAADF- and LAADF-STEM are illustrated. To study the electron beam channeling through BaSnO3/LaAlO3 bilayers, probe intensity depth profiles are calculated, and the effects of probe defocus and atomic column alignment are discussed. Characteristics of the beam channeling are correlated to resulting ADF-STEM images, which is then tested by comparing focal series of plan-view HAADF-STEM images to those recorded experimentally. Additionally, discussions on how to visualize the misfit dislocation network at the BaSnO3/LaAlO3 interface using HAADF- and LAADF-STEM images are provided.",

keywords = "BaSnO, Channeling, Focal series, HAADF, Heterostructure, LAADF, LaAlO, Multislice, STEM",

author = "Hwanhui Yun and Abhinav Prakash and Bharat Jalan and Jeong, {Jong Seok} and Mkhoyan, {K. Andre}",

note = "Funding Information: This work is supported in part by SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by University of Minnesota (UMN) MRSEC program under award no. DMR-1420013. This work utilized the College of Science and Engineering (CSE) Characterization Facility, UMN, supported in part by the NSF through the UMN MRSEC program. Thin film growth work was supported by the National Science Foundation through DMR-1741801, UMN MRSEC program under award no. DMR-1420013 and through the Young Investigator Program of the Air Force Office of Scientific Research (AFOSR) through grant no. FA9550-16- 1-0205. H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea. Funding Information: This work is supported in part by SMART , one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by University of Minnesota (UMN) MRSEC program under award no. DMR-1420013 . This work utilized the College of Science and Engineering (CSE) Characterization Facility, UMN, supported in part by the NSF through the UMN MRSEC program. Thin film growth work was supported by the National Science Foundation through DMR- 1741801 , UMN MRSEC program under award no. DMR-1420013 and through the Young Investigator Program of the Air Force Office of Scientific Research (AFOSR) through grant no. FA9550-16- 1-0205 . H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea. Publisher Copyright: {\textcopyright} 2019 Elsevier B.V.",

year = "2020",

month = jan,

doi = "10.1016/j.ultramic.2019.112863",

language = "English (US)",

volume = "208",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

}

TY - JOUR

T1 - STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network

AU - Yun, Hwanhui

AU - Prakash, Abhinav

AU - Jalan, Bharat

AU - Jeong, Jong Seok

AU - Mkhoyan, K. Andre

N1 - Funding Information: This work is supported in part by SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by University of Minnesota (UMN) MRSEC program under award no. DMR-1420013. This work utilized the College of Science and Engineering (CSE) Characterization Facility, UMN, supported in part by the NSF through the UMN MRSEC program. Thin film growth work was supported by the National Science Foundation through DMR-1741801, UMN MRSEC program under award no. DMR-1420013 and through the Young Investigator Program of the Air Force Office of Scientific Research (AFOSR) through grant no. FA9550-16- 1-0205. H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea. Funding Information: This work is supported in part by SMART , one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by University of Minnesota (UMN) MRSEC program under award no. DMR-1420013 . This work utilized the College of Science and Engineering (CSE) Characterization Facility, UMN, supported in part by the NSF through the UMN MRSEC program. Thin film growth work was supported by the National Science Foundation through DMR- 1741801 , UMN MRSEC program under award no. DMR-1420013 and through the Young Investigator Program of the Air Force Office of Scientific Research (AFOSR) through grant no. FA9550-16- 1-0205 . H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea. Publisher Copyright: © 2019 Elsevier B.V.

PY - 2020/1

Y1 - 2020/1

N2 - A study of the STEM probe channeling in a heterostructured crystalline bilayer specimens is presented here with a goal to guide STEM-based characterization of multilayer structures. STEM analysis of perovskite BaSnO3/LaAlO3 bilayers is performed and the dominating effects of beam channeling on HAADF- and LAADF-STEM are illustrated. To study the electron beam channeling through BaSnO3/LaAlO3 bilayers, probe intensity depth profiles are calculated, and the effects of probe defocus and atomic column alignment are discussed. Characteristics of the beam channeling are correlated to resulting ADF-STEM images, which is then tested by comparing focal series of plan-view HAADF-STEM images to those recorded experimentally. Additionally, discussions on how to visualize the misfit dislocation network at the BaSnO3/LaAlO3 interface using HAADF- and LAADF-STEM images are provided.

AB - A study of the STEM probe channeling in a heterostructured crystalline bilayer specimens is presented here with a goal to guide STEM-based characterization of multilayer structures. STEM analysis of perovskite BaSnO3/LaAlO3 bilayers is performed and the dominating effects of beam channeling on HAADF- and LAADF-STEM are illustrated. To study the electron beam channeling through BaSnO3/LaAlO3 bilayers, probe intensity depth profiles are calculated, and the effects of probe defocus and atomic column alignment are discussed. Characteristics of the beam channeling are correlated to resulting ADF-STEM images, which is then tested by comparing focal series of plan-view HAADF-STEM images to those recorded experimentally. Additionally, discussions on how to visualize the misfit dislocation network at the BaSnO3/LaAlO3 interface using HAADF- and LAADF-STEM images are provided.

KW - BaSnO

KW - Channeling

KW - Focal series

KW - HAADF

KW - Heterostructure

KW - LAADF

KW - LaAlO

KW - Multislice

KW - STEM

UR - http://www.scopus.com/inward/record.url?scp=85074192992&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85074192992&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2019.112863

DO - 10.1016/j.ultramic.2019.112863

M3 - Article

C2 - 31683082

AN - SCOPUS:85074192992

SN - 0304-3991

VL - 208

JO - Ultramicroscopy

JF - Ultramicroscopy

M1 - 112863

ER -

STEM beam channeling in BaSnO₃/LaAlO₃ perovskite bilayers and visualization of 2D misfit dislocation network

Abstract

Bibliographical note

Keywords

MRSEC Support

PubMed: MeSH publication types

Publisher link

Find It

Other files and links

Fingerprint

MRSEC IRG-2: Sustainable Nanocrystal Materials

MRSEC IRG-1: Electrostatic Control of Materials

University of Minnesota MRSEC (DMR-1420013)

Cite this

STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network

Abstract

Bibliographical note

Keywords

MRSEC Support

PubMed: MeSH publication types

Publisher link

Find It

Other files and links

Fingerprint

Projects

MRSEC IRG-2: Sustainable Nanocrystal Materials

MRSEC IRG-1: Electrostatic Control of Materials

University of Minnesota MRSEC (DMR-1420013)

Cite this

STEM beam channeling in BaSnO₃/LaAlO₃ perovskite bilayers and visualization of 2D misfit dislocation network