STEM ADF and EELS Study of Strain and Doping Effects in SrTiO3

Research output: Contribution to journalComment/debate

Original languageEnglish (US)
Pages (from-to)310-311
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - Jan 1 2012

Fingerprint

Electron energy loss spectroscopy
Doping (additives)

Cite this

STEM ADF and EELS Study of Strain and Doping Effects in SrTiO3. / Jeong, J. S.; Ambwani, P.; Leighton, C.; Mkhoyan, K. A.

In: Microscopy and Microanalysis, Vol. 18, 01.01.2012, p. 310-311.

Research output: Contribution to journalComment/debate

@article{390d0533b9fa47579ccd157915299804,
title = "STEM ADF and EELS Study of Strain and Doping Effects in SrTiO3",
author = "Jeong, {J. S.} and P. Ambwani and C. Leighton and Mkhoyan, {K. A.}",
year = "2012",
month = "1",
day = "1",
doi = "10.1017/S1431927612003406",
language = "English (US)",
volume = "18",
pages = "310--311",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",

}

TY - JOUR

T1 - STEM ADF and EELS Study of Strain and Doping Effects in SrTiO3

AU - Jeong, J. S.

AU - Ambwani, P.

AU - Leighton, C.

AU - Mkhoyan, K. A.

PY - 2012/1/1

Y1 - 2012/1/1

UR - http://www.scopus.com/inward/record.url?scp=84947581968&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84947581968&partnerID=8YFLogxK

U2 - 10.1017/S1431927612003406

DO - 10.1017/S1431927612003406

M3 - Comment/debate

AN - SCOPUS:84947581968

VL - 18

SP - 310

EP - 311

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

ER -