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Steep-slope hysteresis-free negative capacitance MoS
2
transistors
Mengwei Si
, Chun Jung Su
, Chunsheng Jiang
, Nathan J. Conrad
, Hong Zhou
, Kerry D. Maize
,
Gang Qiu
, Chien Ting Wu
, Ali Shakouri
, Muhammad A. Alam
, Peide D. Ye
Research output
:
Contribution to journal
›
Article
›
peer-review
512
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Scopus citations
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2
transistors'. Together they form a unique fingerprint.
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Keyphrases
MOSFET
100%
Room Temperature
100%
Negative Capacitance
100%
Steep Slope
100%
Thermionic
100%
MoS2 Transistor
100%
Hysteresis-free
100%
Subthreshold Slope
100%
Electrostatic Control
50%
Two Dimensional
50%
Gate Dielectric
50%
Supply Voltage
50%
Power Consumption
50%
Carbon Nanotube Field Effect Transistor (CNTFET)
50%
Promising Solutions
50%
Excellent Performance
50%
Oxide Layer
50%
Drain Current
50%
Negative Differential Resistance
50%
Gate Stack
50%
Voltage Power
50%
Overall Power
50%
Molybdenite
50%
Low Dielectric Constant
50%
2D Semiconductors
50%
Self-heating Effect
50%
Dielectric Stack
50%
Drain Induced Barrier Lowering
50%
Atomically Thin Transition Metal Dichalcogenides
50%
Steep-slope Transistors
50%
Junctionless Transistor
50%
Boltzmann's Tyranny
50%
Hafnium Zirconium Oxide
50%
Negative Capacitor
50%
On-state Current
50%
Molybdenum Disulfide MoS2
50%
Material Science
Transistor
100%
Capacitance
100%
Ferroelectric Material
66%
Metal-Oxide-Semiconductor Field-Effect Transistor
66%
Field Effect Transistors
33%
Capacitor
33%
Molybdenum
33%
Zirconia
33%
Permittivity
33%
Hafnium
33%
Transition Metal Dichalcogenides
33%
Dielectric Material
33%
Chemistry
Molybdenum Disulfide
100%
Metal Oxide
50%
Ambient Reaction Temperature
50%
Field Effect
50%
Dielectric Material
25%
Zirconia
25%
Drain Current
25%
Dielectric Constant
25%
Hafnium
25%
Boltzmann Equation
25%
Permittivity
25%
Transition Metal Dichalcogenide
25%