The Stellar X-Ray Polarimeter (SXRP) will be the third orbiting stellar x-ray polarimeter, and should provide an order of magnitude increase in polarization sensitivity over its predecessors. The SXRP exploits the polarization dependence of reflection from a graphite Bragg crystal and scattering from a lithium Thomsom scattering target to measure the linear polarization of x-rays from astrophysical sources. In this paper, we review the status of the SXRP instrument.
|Original language||English (US)|
|Number of pages||6|
|Journal||Proceedings of SPIE - The International Society for Optical Engineering|
|State||Published - Feb 15 1994|
|Event||X-Ray and Ultraviolet Polarimetry 1993 - San Diego, United States|
Duration: Jul 11 1993 → Jul 16 1993