TY - JOUR
T1 - Statistical timing analysis considering spatial correlations using a single PERT-like traversal
AU - Chang, Hongliang
AU - Sapatnekar, Sachin S
PY - 2003
Y1 - 2003
N2 - We present an efficient statistical timing analysis algorithm that predicts the probability distribution of the circuit delay while incorporating the effects of spatial correlations of intra-die parameter variations, using a method based on principal component analysis. The method uses a PERT-like circuit graph traversal, and has a run-time that is linear in the number of gates and interconnects, as well as the number of grid partitions used to model spatial correlations. On average, the mean and standard deviation values computed by our method have errors of 0.2% and 0.9%, respectively, in comparison with a Monte Carlo simulation.
AB - We present an efficient statistical timing analysis algorithm that predicts the probability distribution of the circuit delay while incorporating the effects of spatial correlations of intra-die parameter variations, using a method based on principal component analysis. The method uses a PERT-like circuit graph traversal, and has a run-time that is linear in the number of gates and interconnects, as well as the number of grid partitions used to model spatial correlations. On average, the mean and standard deviation values computed by our method have errors of 0.2% and 0.9%, respectively, in comparison with a Monte Carlo simulation.
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M3 - Conference article
AN - SCOPUS:0346778721
SN - 1092-3152
SP - 621
EP - 625
JO - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
JF - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
T2 - IEEE/ACM International Conference on Computer Aided Design ICCAD 2003: IEEE/ACM Digest of Technical Papers
Y2 - 9 November 2003 through 13 November 2003
ER -