Statistical Study of Hard X-Ray Emitting Electrons Associated with Flare-related Coronal Jets

Sophie Musset, Mariana Jeunon, Lindsay Glesener

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

We present the statistical analysis of 33 flare-related coronal jets, and discuss the link between the jet and the flare properties in these events. We selected jets that were observed between 2010 and 2016 by the Atmospheric Imaging Assembly (AIA) on board the Solar Dynamic Observatory (SDO) that are temporally and spatially associated with flares observed by the Reuven Ramaty High Energy Solar Spectrometric Imager (RHESSI). For each jet, we calculated the jet duration and projected velocity in the plane of sky. The jet duration distribution has a median of 18.8 minutes. The projected velocities are between 31 and 456 km s-1, with a median at 210 km s-1. For each associated flare, we performed X-ray imaging and spectroscopy and identify nonthermal emission. Nonthermal emission was detected in only 1/4 of the events considered. We did not find a clear correlation between the flare thermal energy or soft X-ray (SXR) peak flux and the jet velocity or jet duration. There is no preferential time delay between the flare and the jet. The X-ray emission is generally located at the base of the jet. The analysis presented in this paper suggests that the flare and jet are part of the same explosive event, that the jet is driven by the propagation of an Alfvénic perturbation, and that the energy partition between flare and jets varies substantially from one event to another.

Original languageEnglish (US)
Article number183
JournalAstrophysical Journal
Volume889
Issue number2
DOIs
StatePublished - Feb 1 2020

Bibliographical note

Publisher Copyright:
© 2020. The American Astronomical Society. All rights reserved.

Fingerprint

Dive into the research topics of 'Statistical Study of Hard X-Ray Emitting Electrons Associated with Flare-related Coronal Jets'. Together they form a unique fingerprint.

Cite this