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Statistical design of integrated circuits
Sachin S. Sapatnekar
Electrical and Computer Engineering
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Keyphrases
Integrated Circuits
100%
Statistical Design
100%
Design Techniques
50%
Process Variation
50%
Optimization Techniques
50%
Small Sets
50%
Manufacturing Yield
50%
Statistical Timing Analysis
50%
Compact Sensor
50%
Post-silicon Tuning
50%
Statistical Optimization
50%
Variational Model
50%
Tuning Approach
50%
Statistical Power Analysis
50%
Post-silicon
50%
Engineering
Design Technique
100%
Optimization Technique
100%
Integrated Circuit
100%
Process Variation
100%
Material Science
Silicon
100%
Electronic Circuit
100%
Statistical Design
100%