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Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

  • Saurabh Kumar
  • , Minki Cho
  • , Luke Everson
  • , Hoonki Kim
  • , Qianying Tang
  • , Paul Mazanec
  • , Pascal Meinerzhagen
  • , Andres Malavasi
  • , Dan Lake
  • , Carlos Tokunaga
  • , Heather Quinn
  • , Muhammad Khellah
  • , James Tschanz
  • , Shekhar Borkar
  • , Vivek De
  • , Chris H. Kim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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