Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Saurabh Kumar, Minki Cho, Luke Everson, Hoonki Kim, Qianying Tang, Paul Mazanec, Pascal Meinerzhagen, Andres Malavasi, Dan Lake, Carlos Tokunaga, Heather Quinn, Muhammad Khellah, James Tschanz, Shekhar Borkar, Vivek De, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

A novel BSC circuit with tunable current starved buffers demonstrates higher sensitivity, scalability & accurate statistical characterization of radiation-induced SET pulse waveforms & flip-flop SER in 14nm tri-gate CMOS, thus enabling improved SER estimation & analysis for a range of supply voltages including NTV.

Original languageEnglish (US)
Title of host publication2017 Symposium on VLSI Technology, VLSI Technology 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
PagesC114-C115
ISBN (Electronic)9784863486058
DOIs
StatePublished - Jul 31 2017
Event37th Symposium on VLSI Technology, VLSI Technology 2017 - Kyoto, Japan
Duration: Jun 5 2017Jun 8 2017

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
ISSN (Print)0743-1562

Other

Other37th Symposium on VLSI Technology, VLSI Technology 2017
CountryJapan
CityKyoto
Period6/5/176/8/17

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