Statistical aging under dynamic voltage scaling: A logarithmic model approach

Keyphrases

• Aging 100%
• Dynamic Voltage Scaling 100%
• Logarithmic Model 100%
• Negative Bias Temperature Instability 66%
• Guard 33%
• Power-law Model 33%
• Aging Mechanism 33%
• Long-term Reliability 33%
• Fast Recovery 33%
• Recovery Phase 33%
• Non-monotonic Behavior 33%
• CMOS Design 33%
• Detrapping 33%
• Log-t 33%
• Reliability Prediction 33%

Engineering

• Voltage Scaling 100%
• Negative-Bias Temperature Instability 66%
• Power Law Model 33%
• Reliability Prediction 33%