Abstract
A novel class of mono-stable static physically unclonable functions (PUFs) for secure key generation and chip identification is proposed. The fundamental concept is demonstrated through a 65 nm prototype that contains two different implementations, as well as several previously proposed PUFs to enable a fair comparison at iso-technology. From a statistical quality viewpoint, the achieved reproducibility and uniqueness are quantified by an intra-PUF Hamming distance (HD) lower than 1 and an inter-PUF HD of 128.35, for a 256-bit PUF output key. The keys generated by the proposed PUF pass all applicable NIST randomness tests. The measured energy per bit is as low as 15 fJ/bit. Native unstable bits are less than 2% at nominal conditions, less than 5% at 0.6-1 V and less than 6% in worst case scenario of 0.6 V voltage and 85 °C temperature, before applying any further post-silicon technique for stability enhancement.
Original language | English (US) |
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Article number | 7397840 |
Pages (from-to) | 763-775 |
Number of pages | 13 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 51 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2016 |
Bibliographical note
Publisher Copyright:© 2015 IEEE.
Keywords
- Current mirror
- hardware security
- physically unclonable functions (PUFs)
- process variation
- secure chip identification