Stability and sensitivity analysis of periodic orbits in Tapping Mode Atomic Force microscopy

Murti V. Salapaka; D. J. Chen; J. P. Cleveland

Stability and sensitivity analysis of periodic orbits in Tapping Mode Atomic Force microscopy

Murti V. Salapaka, D. J. Chen, J. P. Cleveland

Electrical and Computer Engineering

Research output: Contribution to journal › Conference article › peer-review

5 Scopus citations

Abstract

In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed.

Original language	English (US)
Pages (from-to)	2047-2052
Number of pages	6
Journal	Proceedings of the IEEE Conference on Decision and Control
Volume	2
State	Published - Dec 1 1998
Event	Proceedings of the 1998 37th IEEE Conference on Decision and Control (CDC) - Tampa, FL, USA Duration: Dec 16 1998 → Dec 18 1998

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title = "Stability and sensitivity analysis of periodic orbits in Tapping Mode Atomic Force microscopy",

abstract = "In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed.",

author = "Salapaka, {Murti V.} and Chen, {D. J.} and Cleveland, {J. P.}",

year = "1998",

month = dec,

day = "1",

language = "English (US)",

volume = "2",

pages = "2047--2052",

journal = "Proceedings of the IEEE Conference on Decision and Control",

issn = "0191-2216",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1998 37th IEEE Conference on Decision and Control (CDC) ; Conference date: 16-12-1998 Through 18-12-1998",

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T1 - Stability and sensitivity analysis of periodic orbits in Tapping Mode Atomic Force microscopy

AU - Salapaka, Murti V.

AU - Chen, D. J.

AU - Cleveland, J. P.

PY - 1998/12/1

Y1 - 1998/12/1

N2 - In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed.

AB - In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed.

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UR - http://www.scopus.com/inward/citedby.url?scp=0032260247&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0032260247

SN - 0191-2216

VL - 2

SP - 2047

EP - 2052

JO - Proceedings of the IEEE Conference on Decision and Control

JF - Proceedings of the IEEE Conference on Decision and Control

T2 - Proceedings of the 1998 37th IEEE Conference on Decision and Control (CDC)

Y2 - 16 December 1998 through 18 December 1998

ER -

Stability and sensitivity analysis of periodic orbits in Tapping Mode Atomic Force microscopy

Abstract

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