Spinodal decomposition and coarsening of stressed thin films on compliant substrates

Perry H Leo, W. C. Johnson

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

The microstructural evolution and long-time coarsening behavior of a thin film attached to a compliant substrate is investigated for a spinodally decomposing, binary, two-phase alloy using a Cahn-Hilliard type equation. Elastic fields arise because of composition dependence of the lattice parameter (compositional self-strain) as well as an average misfit between the film and substrate. This leads to a local mass flux within the film that depends on the global composition field as well as the thickness and elastic properties of the substrate. Three distinct coarsening regimes are observed: a rapid initial stage of spinodal decomposition into alternating phases, a transition region where internal interfaces grow and coalesce, and a final coarsening regime where the outermost layers grow with little change in the internal structure. An asymptotic expression for the long-time coarsening rate is derived as a function of the compositional self-strain, the average misfit strain, the film thickness and the total (film plus substrate) thickness. The analytic predictions are in good agreement with numerical simulations for a variety of film and substrate thicknesses and compositional and average film misfit strains.

Original languageEnglish (US)
Pages (from-to)1771-1787
Number of pages17
JournalActa Materialia
Volume49
Issue number10
DOIs
StatePublished - Jun 13 2001

Fingerprint

Spinodal decomposition
Coarsening
Thin films
Substrates
Microstructural evolution
Chemical analysis
Lattice constants
Film thickness
Mass transfer
Computer simulation

Keywords

  • Coarsening
  • Diffusion
  • Kinetics
  • Phase transformations (nucleation, growth)
  • Theory & modeling
  • Thin films
  • Transport

Cite this

Spinodal decomposition and coarsening of stressed thin films on compliant substrates. / Leo, Perry H; Johnson, W. C.

In: Acta Materialia, Vol. 49, No. 10, 13.06.2001, p. 1771-1787.

Research output: Contribution to journalArticle

@article{de17a08086894f9c92229692ea808ffd,
title = "Spinodal decomposition and coarsening of stressed thin films on compliant substrates",
abstract = "The microstructural evolution and long-time coarsening behavior of a thin film attached to a compliant substrate is investigated for a spinodally decomposing, binary, two-phase alloy using a Cahn-Hilliard type equation. Elastic fields arise because of composition dependence of the lattice parameter (compositional self-strain) as well as an average misfit between the film and substrate. This leads to a local mass flux within the film that depends on the global composition field as well as the thickness and elastic properties of the substrate. Three distinct coarsening regimes are observed: a rapid initial stage of spinodal decomposition into alternating phases, a transition region where internal interfaces grow and coalesce, and a final coarsening regime where the outermost layers grow with little change in the internal structure. An asymptotic expression for the long-time coarsening rate is derived as a function of the compositional self-strain, the average misfit strain, the film thickness and the total (film plus substrate) thickness. The analytic predictions are in good agreement with numerical simulations for a variety of film and substrate thicknesses and compositional and average film misfit strains.",
keywords = "Coarsening, Diffusion, Kinetics, Phase transformations (nucleation, growth), Theory & modeling, Thin films, Transport",
author = "Leo, {Perry H} and Johnson, {W. C.}",
year = "2001",
month = "6",
day = "13",
doi = "10.1016/S1359-6454(01)00084-2",
language = "English (US)",
volume = "49",
pages = "1771--1787",
journal = "Acta Materialia",
issn = "1359-6454",
publisher = "Elsevier Limited",
number = "10",

}

TY - JOUR

T1 - Spinodal decomposition and coarsening of stressed thin films on compliant substrates

AU - Leo, Perry H

AU - Johnson, W. C.

PY - 2001/6/13

Y1 - 2001/6/13

N2 - The microstructural evolution and long-time coarsening behavior of a thin film attached to a compliant substrate is investigated for a spinodally decomposing, binary, two-phase alloy using a Cahn-Hilliard type equation. Elastic fields arise because of composition dependence of the lattice parameter (compositional self-strain) as well as an average misfit between the film and substrate. This leads to a local mass flux within the film that depends on the global composition field as well as the thickness and elastic properties of the substrate. Three distinct coarsening regimes are observed: a rapid initial stage of spinodal decomposition into alternating phases, a transition region where internal interfaces grow and coalesce, and a final coarsening regime where the outermost layers grow with little change in the internal structure. An asymptotic expression for the long-time coarsening rate is derived as a function of the compositional self-strain, the average misfit strain, the film thickness and the total (film plus substrate) thickness. The analytic predictions are in good agreement with numerical simulations for a variety of film and substrate thicknesses and compositional and average film misfit strains.

AB - The microstructural evolution and long-time coarsening behavior of a thin film attached to a compliant substrate is investigated for a spinodally decomposing, binary, two-phase alloy using a Cahn-Hilliard type equation. Elastic fields arise because of composition dependence of the lattice parameter (compositional self-strain) as well as an average misfit between the film and substrate. This leads to a local mass flux within the film that depends on the global composition field as well as the thickness and elastic properties of the substrate. Three distinct coarsening regimes are observed: a rapid initial stage of spinodal decomposition into alternating phases, a transition region where internal interfaces grow and coalesce, and a final coarsening regime where the outermost layers grow with little change in the internal structure. An asymptotic expression for the long-time coarsening rate is derived as a function of the compositional self-strain, the average misfit strain, the film thickness and the total (film plus substrate) thickness. The analytic predictions are in good agreement with numerical simulations for a variety of film and substrate thicknesses and compositional and average film misfit strains.

KW - Coarsening

KW - Diffusion

KW - Kinetics

KW - Phase transformations (nucleation, growth)

KW - Theory & modeling

KW - Thin films

KW - Transport

UR - http://www.scopus.com/inward/record.url?scp=0035854102&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035854102&partnerID=8YFLogxK

U2 - 10.1016/S1359-6454(01)00084-2

DO - 10.1016/S1359-6454(01)00084-2

M3 - Article

AN - SCOPUS:0035854102

VL - 49

SP - 1771

EP - 1787

JO - Acta Materialia

JF - Acta Materialia

SN - 1359-6454

IS - 10

ER -