Spin-Coated V2O5 Xerogel Thin Films. 1. Microstructure and Morphology

Stefano Passerini, David Chang, Xi Chu, Dinh Ba Le, William H Smyrl

Research output: Contribution to journalArticlepeer-review

52 Scopus citations

Abstract

Vanadium pentoxide xerogel films spin-coated on nickel/silicon substrates have shown high electrochemical performance. In fact, more than 3 equiv of lithium V2O5 unit can be reversibly inserted between 3.5 and 1.6 V in aprotic electrolytes. The high insertion capacity coupled with the inexpensive and well-known preparation procedure make the material interesting for thin-film lithium battery and electrochromic device applications. In the present paper we report the characterization of such thin films based on X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), quartz crystal microbalance, optical, and electronic conductivity measurements. The spin-coated films are highly amorphous, with a small amount of ribbon stacking that is randomly oriented. The disorder is caused by the joint effect of high shear and rapid drying during spin coating.

Original languageEnglish (US)
Pages (from-to)780-785
Number of pages6
JournalChemistry of Materials
Volume7
Issue number4
DOIs
StatePublished - Apr 1995

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