Abstract
A spin-based analog-to-digital converter (ADC) using magnetic tunnel junctions (MTJs) is proposed in this letter. Our proposal is based on a novel high-speed low-power MTJ comparator that is controlled through spin Hall effect and voltage-controlled magnetic anisotropy effects. According to the simulation results, spin ADC offers features including high sampling rate, low-power consumption, and less chip area occupation for higher bit resolution while provides the benefit of nonvolatility of conversion results.
Original language | English (US) |
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Article number | 7070706 |
Pages (from-to) | 511-513 |
Number of pages | 3 |
Journal | IEEE Electron Device Letters |
Volume | 36 |
Issue number | 5 |
DOIs | |
State | Published - May 1 2015 |
Bibliographical note
Publisher Copyright:© 1980-2012 IEEE.
Keywords
- Analog-to-digital converter (ADC)
- magnetic tunnel junction
- spin hall effect
- voltage controlled magnetic anisotropy