Spatio-temporal classification at multiple resolutions using multi-view regularization

Guruprasad Nayak, Rahul Ghosh, Xiaowei Jia, Varun Mithal, Vipin Kumar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, we present a multi-view framework to classify spatio-temporal phenomena at multiple resolutions. This approach utilizes the complementarity of features across different resolutions and improves the corresponding models by enforcing consistency of their predictions on unlabeled data. Unlike traditional multi-view learning problems, the key challenge in our case is that there is a many-to-one correspondence between instances across different resolutions, which needs to be explicitly modeled. Experiments on the real-world application of mapping urban areas using spatial raster data-sets from satellite observations show the benefits of the proposed multi-view framework.

Original languageEnglish (US)
Title of host publicationProceedings - 2019 IEEE International Conference on Big Data, Big Data 2019
EditorsChaitanya Baru, Jun Huan, Latifur Khan, Xiaohua Tony Hu, Ronay Ak, Yuanyuan Tian, Roger Barga, Carlo Zaniolo, Kisung Lee, Yanfang Fanny Ye
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages4117-4120
Number of pages4
ISBN (Electronic)9781728108582
DOIs
StatePublished - Dec 2019
Event2019 IEEE International Conference on Big Data, Big Data 2019 - Los Angeles, United States
Duration: Dec 9 2019Dec 12 2019

Publication series

NameProceedings - 2019 IEEE International Conference on Big Data, Big Data 2019

Conference

Conference2019 IEEE International Conference on Big Data, Big Data 2019
CountryUnited States
CityLos Angeles
Period12/9/1912/12/19

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Keywords

  • multi-instance learning
  • multi-resolution classification
  • remote sensing

Cite this

Nayak, G., Ghosh, R., Jia, X., Mithal, V., & Kumar, V. (2019). Spatio-temporal classification at multiple resolutions using multi-view regularization. In C. Baru, J. Huan, L. Khan, X. T. Hu, R. Ak, Y. Tian, R. Barga, C. Zaniolo, K. Lee, & Y. F. Ye (Eds.), Proceedings - 2019 IEEE International Conference on Big Data, Big Data 2019 (pp. 4117-4120). [9006597] (Proceedings - 2019 IEEE International Conference on Big Data, Big Data 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/BigData47090.2019.9006597