Simultaneous multi-region background subtraction for core-level EEL spectra

Jacob T. Held; Hwanhui Yun; K. Andre Mkhoyan

doi:10.1016/j.ultramic.2019.112919

Simultaneous multi-region background subtraction for core-level EEL spectra

Jacob T. Held, Hwanhui Yun, K. Andre Mkhoyan

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4 Scopus citations

Abstract

We present a multi-region extension of power law background subtraction for core-level EEL spectra to improve the robustness of background removal. This method takes advantage of the post-edge shape of core-loss EEL edges to enable simultaneous fitting of pre- and post-edge background regions. This method also produces simultaneous and consistent background removal from multiple edges in a single EEL spectrum. The stability of this method with respect to the fitting energy window and the EELS signal to noise ratio is also discussed.

Original language	English (US)
Article number	112919
Pages (from-to)	112919
Journal	Ultramicroscopy
Volume	210
DOIs	https://doi.org/10.1016/j.ultramic.2019.112919
State	Published - Mar 1 2020

Bibliographical note

Funding Information:
This work is supported in part by SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by UMN MRSEC program under award no. DMR-1420013. This work utilized the College of Science and Engineering Characterization Facility, University of Minnesota, supported in part by the NSF through the UMN MRSEC program. H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea. J. T. H. acknowledges support from a Doctoral Dissertation Fellowship received from the graduate school at the University of Minnesota.

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© 2019 Elsevier B.V.

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PubMed: MeSH publication types

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10.1016/j.ultramic.2019.112919

https://linkinghub.elsevier.com/retrieve/pii/S0304399119302116

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University of Minnesota MRSEC (DMR-1420013)
Lodge, T. P. (PI)
11/1/14 → 10/31/20
Project: Research project
MRSEC IRG-2: Sustainable Nanocrystal Materials
Kortshagen, U. R. (Coordinator), Aydil, E. S. (Senior Investigator), Campbell, S. A. (Senior Investigator), Francis, L. F. (Senior Investigator), Haynes, C. L. (Senior Investigator), Hogan, C. (Senior Investigator), Mkhoyan, A. (Senior Investigator), Shklovskii, B. I. (Senior Investigator) & Wang, X. (Senior Investigator)
11/1/14 → 10/31/20
Project: Research project

Cite this

@article{5d73d48f61894a47bbbdb82f7c48fde4,

title = "Simultaneous multi-region background subtraction for core-level EEL spectra",

abstract = "We present a multi-region extension of power law background subtraction for core-level EEL spectra to improve the robustness of background removal. This method takes advantage of the post-edge shape of core-loss EEL edges to enable simultaneous fitting of pre- and post-edge background regions. This method also produces simultaneous and consistent background removal from multiple edges in a single EEL spectrum. The stability of this method with respect to the fitting energy window and the EELS signal to noise ratio is also discussed.",

author = "Held, {Jacob T.} and Hwanhui Yun and Mkhoyan, {K. Andre}",

note = "Funding Information: This work is supported in part by SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by UMN MRSEC program under award no. DMR-1420013. This work utilized the College of Science and Engineering Characterization Facility, University of Minnesota, supported in part by the NSF through the UMN MRSEC program. H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea. J. T. H. acknowledges support from a Doctoral Dissertation Fellowship received from the graduate school at the University of Minnesota. Publisher Copyright: {\textcopyright} 2019 Elsevier B.V.",

year = "2020",

month = mar,

day = "1",

doi = "10.1016/j.ultramic.2019.112919",

language = "English (US)",

volume = "210",

pages = "112919",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Simultaneous multi-region background subtraction for core-level EEL spectra

AU - Held, Jacob T.

AU - Yun, Hwanhui

AU - Mkhoyan, K. Andre

N1 - Funding Information: This work is supported in part by SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by UMN MRSEC program under award no. DMR-1420013. This work utilized the College of Science and Engineering Characterization Facility, University of Minnesota, supported in part by the NSF through the UMN MRSEC program. H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea. J. T. H. acknowledges support from a Doctoral Dissertation Fellowship received from the graduate school at the University of Minnesota. Publisher Copyright: © 2019 Elsevier B.V.

PY - 2020/3/1

Y1 - 2020/3/1

N2 - We present a multi-region extension of power law background subtraction for core-level EEL spectra to improve the robustness of background removal. This method takes advantage of the post-edge shape of core-loss EEL edges to enable simultaneous fitting of pre- and post-edge background regions. This method also produces simultaneous and consistent background removal from multiple edges in a single EEL spectrum. The stability of this method with respect to the fitting energy window and the EELS signal to noise ratio is also discussed.

AB - We present a multi-region extension of power law background subtraction for core-level EEL spectra to improve the robustness of background removal. This method takes advantage of the post-edge shape of core-loss EEL edges to enable simultaneous fitting of pre- and post-edge background regions. This method also produces simultaneous and consistent background removal from multiple edges in a single EEL spectrum. The stability of this method with respect to the fitting energy window and the EELS signal to noise ratio is also discussed.

U2 - 10.1016/j.ultramic.2019.112919

DO - 10.1016/j.ultramic.2019.112919

M3 - Article

C2 - 31911393

SN - 0304-3991

VL - 210

SP - 112919

JO - Ultramicroscopy

JF - Ultramicroscopy

M1 - 112919

ER -

Simultaneous multi-region background subtraction for core-level EEL spectra

Abstract

Bibliographical note

MRSEC Support

PubMed: MeSH publication types

Publisher link

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Projects

University of Minnesota MRSEC (DMR-1420013)

MRSEC IRG-2: Sustainable Nanocrystal Materials

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