Simultaneous multi-region background subtraction for core-level EEL spectra

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Abstract

We present a multi-region extension of power law background subtraction for core-level EEL spectra to improve the robustness of background removal. This method takes advantage of the post-edge shape of core-loss EEL edges to enable simultaneous fitting of pre- and post-edge background regions. This method also produces simultaneous and consistent background removal from multiple edges in a single EEL spectrum. The stability of this method with respect to the fitting energy window and the EELS signal to noise ratio is also discussed.

Original languageEnglish (US)
Article number112919
Pages (from-to)112919
JournalUltramicroscopy
Volume210
DOIs
StatePublished - Mar 1 2020

Bibliographical note

Funding Information:
This work is supported in part by SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by National Institute of Standards and Technology (NIST), and by UMN MRSEC program under award no. DMR-1420013. This work utilized the College of Science and Engineering Characterization Facility, University of Minnesota, supported in part by the NSF through the UMN MRSEC program. H. Y. acknowledges a fellowship from the Samsung Scholarship Foundation, Republic of Korea. J. T. H. acknowledges support from a Doctoral Dissertation Fellowship received from the graduate school at the University of Minnesota.

Publisher Copyright:
© 2019 Elsevier B.V.

How much support was provided by MRSEC?

  • Partial

PubMed: MeSH publication types

  • Journal Article

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