Simultaneous bidirectional PAM-4 link with built-in self-test

Ming Ta Hsieh, Gerald E Sobelman

Research output: Chapter in Book/Report/Conference proceedingConference contribution


This paper presents a new design of a simultaneous bidirectional PAM-4 wired transmission system that uses built-in self-test (BIST) to adjust the level of pre-emaphsis that is applied. The BIST circuitry consists of a pattern generator and detector, a signal comparator and a high-pass filter. It outputs an error indicator that is used as a control signal in the adaptive pre-emphasis block. The feedback loop inherent in a simultaneous bidirectional link provides a natural opportunity to carry information about the channel characteristics without the need for an extra dedicated wire. The design has been verified using the Cadence SpectreRF and Verilog-A simulators and the channel loss characteristics are based on an FR-4 material model extracted from the Cadence Transmission Line Model Generator.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE International SOC Conference
EditorsJ. Chickanosky, D. Ha, R. Auletta
Number of pages4
StatePublished - Dec 1 2004
EventProceedings - IEEE International SOC Conference - Santa Clara, CA, United States
Duration: Sep 12 2004Sep 15 2004

Publication series

NameProceedings - IEEE International SOC Conference


OtherProceedings - IEEE International SOC Conference
CountryUnited States
CitySanta Clara, CA

Fingerprint Dive into the research topics of 'Simultaneous bidirectional PAM-4 link with built-in self-test'. Together they form a unique fingerprint.

Cite this