Silicon odometers: Compact in situ aging sensors for robust system design

Xiaofei Wang; John Keane; Tony Tae Hyoung Kim; Pulkit Jain; Qianying Tang; Chris H. Kim

doi:10.1109/MM.2014.2

Silicon odometers: Compact in situ aging sensors for robust system design

Xiaofei Wang, John Keane, Tony Tae Hyoung Kim, Pulkit Jain, Qianying Tang, Chris H. Kim

Electrical and Computer Engineering

Research output: Contribution to journal › Review article › peer-review

20 Scopus citations

Abstract

This article reviews several unique test-chip designs that demonstrate the benefits of utilizing on-chip logic and a simple test interface to automate circuit aging experiments. This new class of compact on-chip sensors can reveal important aspects of circuit aging that would otherwise be impossible to measure, facilitate the collection of reliability data from systems deployed in the field, and eventually lead us down the path to real-time aging compensation in future processors.

Original language	English (US)
Article number	6728928
Pages (from-to)	74-85
Number of pages	12
Journal	IEEE Micro
Volume	34
Issue number	6
DOIs	https://doi.org/10.1109/MM.2014.2
State	Published - Nov 1 2014

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

Keywords

Aging
Bias temperature instability
Circuit reliability
Circuit stability
Frequency measurement
Hot carrier injection
In-situ sensor
Monitoring
Network-on-chip
Odometers
On-chip sensor
Random telegraph noise
Reliability monitor
Sensors
Telegraphy
Temperature measurement
Time-dependent dielectric breakdown
Variation

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10.1109/MM.2014.2

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title = "Silicon odometers: Compact in situ aging sensors for robust system design",

abstract = "This article reviews several unique test-chip designs that demonstrate the benefits of utilizing on-chip logic and a simple test interface to automate circuit aging experiments. This new class of compact on-chip sensors can reveal important aspects of circuit aging that would otherwise be impossible to measure, facilitate the collection of reliability data from systems deployed in the field, and eventually lead us down the path to real-time aging compensation in future processors.",

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AU - Wang, Xiaofei

AU - Keane, John

AU - Kim, Tony Tae Hyoung

AU - Jain, Pulkit

AU - Tang, Qianying

AU - Kim, Chris H.

PY - 2014/11/1

Y1 - 2014/11/1

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KW - Aging

KW - Bias temperature instability

KW - Circuit reliability

KW - Circuit stability

KW - Frequency measurement

KW - Hot carrier injection

KW - In-situ sensor

KW - Monitoring

KW - Network-on-chip

KW - Odometers

KW - On-chip sensor

KW - Random telegraph noise

KW - Reliability monitor

KW - Sensors

KW - Telegraphy

KW - Temperature measurement

KW - Time-dependent dielectric breakdown

KW - Variation

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Silicon odometers: Compact in situ aging sensors for robust system design

Abstract

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