Abstract
The thermal stability of sputtered Co-Cu-Ag tri-phase immiscible nanocomposites (TPINs) was compared to nanocrystalline Cu 50Ag 50 and monolithic Cu. After annealing at 973 K, the grain size of Co 34Cu 33Ag 33 was ∼115 nm, whereas that of Cu 50Ag 50 increased to over 700 nm. The hardness of annealed Co 34Cu 33Ag 33 TPIN remained high, ∼3 GPa, comparing to only 1.0 GPa for Cu 50Ag 50 film. The remarkable thermal stability of the TPIN is largely achieved via the introduction of a third immiscible phase, forming abundant tri-phase triple junctions.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 177-180 |
| Number of pages | 4 |
| Journal | Scripta Materialia |
| Volume | 67 |
| Issue number | 2 |
| DOIs | |
| State | Published - Jul 2012 |
Bibliographical note
Funding Information:X.Z. acknowledges financial support by US Army Research Office—Materials Science Division, under contract no. W911NF-09-1-0223. Partial supports by DOE-NEUP under contract no. DE-AC07-05ID14517-00088120 and NSF 1129065 are also acknowledged. We also acknowledge the usage of microscopes at the Microscopy and Imaging Center at Texas A&M University.
Keywords
- Hardness
- Nanocrystalline metals
- Thermal stability
- Tri-phase immiscible nanocomposites
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