SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities

John D. Cressler; Chris Coen; Saeed Zeinolabedinzadeh; Peter Song; Rob Schmid; Michael Oakley; Partha Chakraborty

doi:10.1109/CSICS.2016.7751065

SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities

John D. Cressler
, Chris Coen
, Saeed Zeinolabedinzadeh
, Peter Song
, Rob Schmid
, Michael Oakley
, Partha Chakraborty

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Scopus citations

Abstract

This paper reviews recent work aimed at a comprehensive assessment of the potential of SiGe technology to support emerging millimeter-wave (mm-wave) and sub-mm-wave integrated circuit applications. Scaling limits, reliability constraints, and the limits of CMOS for mm-wave are addressed, followed by a diverse variety of mm-wave and sub-mm-wave SiGe circuits that are offered as examples of the many opportunities awaiting.

Original language	English (US)
Title of host publication	2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509016082
DOIs	https://doi.org/10.1109/CSICS.2016.7751065
State	Published - Nov 21 2016
Externally published	Yes
Event	2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Austin, United States Duration: Oct 23 2016 → Oct 26 2016

Publication series

Name	Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC
Volume	2016-November
ISSN (Print)	1550-8781

Conference

Conference	2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016
Country/Territory	United States
City	Austin
Period	10/23/16 → 10/26/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

Publisher link

10.1109/CSICS.2016.7751065

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Cressler, J. D., Coen, C., Zeinolabedinzadeh, S., Song, P., Schmid, R., Oakley, M., & Chakraborty, P. (2016). SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities. In 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest Article 7751065 (Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC; Vol. 2016-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CSICS.2016.7751065

SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities. / Cressler, John D.; Coen, Chris; Zeinolabedinzadeh, Saeed et al.
2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest. Institute of Electrical and Electronics Engineers Inc., 2016. 7751065 (Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC; Vol. 2016-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cressler, JD, Coen, C, Zeinolabedinzadeh, S, Song, P, Schmid, R, Oakley, M & Chakraborty, P 2016, SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities. in 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest., 7751065, Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC, vol. 2016-November, Institute of Electrical and Electronics Engineers Inc., 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016, Austin, United States, 10/23/16. https://doi.org/10.1109/CSICS.2016.7751065

Cressler JD, Coen C, Zeinolabedinzadeh S, Song P, Schmid R, Oakley M et al. SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities. In 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest. Institute of Electrical and Electronics Engineers Inc. 2016. 7751065. (Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC). doi: 10.1109/CSICS.2016.7751065

Cressler, John D. ; Coen, Chris ; Zeinolabedinzadeh, Saeed et al. / SiGe Technology as a Millimeter-Wave Platform : Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities. 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest. Institute of Electrical and Electronics Engineers Inc., 2016. (Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC).

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SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities

Abstract

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Bibliographical note

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