Separation of bulk and surface-losses in low-loss EELS measurements in STEM

K. A. Mkhoyan; T. Babinec; S. E. Maccagnano; E. J. Kirkland; J. Silcox

doi:10.1017/S1431927606063045

Separation of bulk and surface-losses in low-loss EELS measurements in STEM

K. A. Mkhoyan, T. Babinec, S. E. Maccagnano, E. J. Kirkland, J. Silcox

Chemical Engineering and Materials Science

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1162-1163
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606063045
State	Published - Aug 2006

Bibliographical note

Funding Information:
This work is supported primarily by the Nanoscale Science and Engineering Initiative of the NSF EEC-0117770 and NYSTAR C020071. The sample preparation facilities and STEM are supported by NSF through the CCMR DMR 9632275. We would also like to acknowledge M. Thomas for technical support.

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10.1017/S1431927606063045

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title = "Separation of bulk and surface-losses in low-loss EELS measurements in STEM",

author = "Mkhoyan, \{K. A.\} and T. Babinec and Maccagnano, \{S. E.\} and Kirkland, \{E. J.\} and J. Silcox",

note = "Funding Information: This work is supported primarily by the Nanoscale Science and Engineering Initiative of the NSF EEC-0117770 and NYSTAR C020071. The sample preparation facilities and STEM are supported by NSF through the CCMR DMR 9632275. We would also like to acknowledge M. Thomas for technical support. ",

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AU - Babinec, T.

AU - Maccagnano, S. E.

AU - Kirkland, E. J.

AU - Silcox, J.

N1 - Funding Information: This work is supported primarily by the Nanoscale Science and Engineering Initiative of the NSF EEC-0117770 and NYSTAR C020071. The sample preparation facilities and STEM are supported by NSF through the CCMR DMR 9632275. We would also like to acknowledge M. Thomas for technical support.

PY - 2006/8

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M3 - Article

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SN - 1431-9276

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Separation of bulk and surface-losses in low-loss EELS measurements in STEM

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