Separation of bulk and surface-losses in low-loss EELS measurements in STEM

K. A. Mkhoyan, T. Babinec, S. E. Maccagnano, E. J. Kirkland, J. Silcox

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1162-1163
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Aug 2006

Bibliographical note

Funding Information:
This work is supported primarily by the Nanoscale Science and Engineering Initiative of the NSF EEC-0117770 and NYSTAR C020071. The sample preparation facilities and STEM are supported by NSF through the CCMR DMR 9632275. We would also like to acknowledge M. Thomas for technical support.

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