Separation of bulk and surface-losses in low-loss EELS measurements in STEM

K. A. Mkhoyan, T. Babinec, S. E. Maccagnano, E. J. Kirkland, J. Silcox

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1162-1163
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006

Bibliographical note

Funding Information:
This work is supported primarily by the Nanoscale Science and Engineering Initiative of the NSF EEC-0117770 and NYSTAR C020071. The sample preparation facilities and STEM are supported by NSF through the CCMR DMR 9632275. We would also like to acknowledge M. Thomas for technical support.

Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.

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