Separation of bulk and surface-losses in low-loss EELS measurements in STEM

K. A. Mkhoyan; T. Babinec; S. E. Maccagnano; E. J. Kirkland; J. Silcox

doi:10.1017/S1431927606063045

Separation of bulk and surface-losses in low-loss EELS measurements in STEM

K. A. Mkhoyan, T. Babinec, S. E. Maccagnano, E. J. Kirkland, J. Silcox

Chemical Engineering and Materials Science

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1162-1163
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606063045
State	Published - Aug 2006

Bibliographical note

Funding Information:
This work is supported primarily by the Nanoscale Science and Engineering Initiative of the NSF EEC-0117770 and NYSTAR C020071. The sample preparation facilities and STEM are supported by NSF through the CCMR DMR 9632275. We would also like to acknowledge M. Thomas for technical support.

Publisher link

10.1017/S1431927606063045

Find It

Find It at U of M Libraries

Cite this

@article{14a084a7f74e4b8a9216a0b365ce9396,

title = "Separation of bulk and surface-losses in low-loss EELS measurements in STEM",

author = "Mkhoyan, {K. A.} and T. Babinec and Maccagnano, {S. E.} and Kirkland, {E. J.} and J. Silcox",

note = "Funding Information: This work is supported primarily by the Nanoscale Science and Engineering Initiative of the NSF EEC-0117770 and NYSTAR C020071. The sample preparation facilities and STEM are supported by NSF through the CCMR DMR 9632275. We would also like to acknowledge M. Thomas for technical support. ",

year = "2006",

month = aug,

doi = "10.1017/S1431927606063045",

language = "English (US)",

volume = "12",

pages = "1162--1163",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Separation of bulk and surface-losses in low-loss EELS measurements in STEM

AU - Mkhoyan, K. A.

AU - Babinec, T.

AU - Maccagnano, S. E.

AU - Kirkland, E. J.

AU - Silcox, J.

N1 - Funding Information: This work is supported primarily by the Nanoscale Science and Engineering Initiative of the NSF EEC-0117770 and NYSTAR C020071. The sample preparation facilities and STEM are supported by NSF through the CCMR DMR 9632275. We would also like to acknowledge M. Thomas for technical support.

PY - 2006/8

Y1 - 2006/8

UR - http://www.scopus.com/inward/record.url?scp=33750845577&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33750845577&partnerID=8YFLogxK

U2 - 10.1017/S1431927606063045

DO - 10.1017/S1431927606063045

M3 - Article

AN - SCOPUS:33750845577

SN - 1431-9276

VL - 12

SP - 1162

EP - 1163

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Separation of bulk and surface-losses in low-loss EELS measurements in STEM

Bibliographical note

Publisher link

Find It

Other files and links

Cite this