This paper shows that performing an XOR operation between the outputs of parallel arbiter PUFs generates a more secure output at the expense of reduced stability. In this work, we evaluate the security and stability of XOR PUFs using 1,000,000 randomly chosen challenges, applied to 10 custom-designed PUF chips, tested for 100,000 cycles per challenge, under different voltage and temperature conditions. Based on extensive hardware data, we propose a practical method for selecting challenges that will produce stable responses. A linear regression approach based on soft responses collected during enrollment phase was used to build accurate models for each individual arbiter PUF. Hardware data from fabricated chips verify that the approach is highly effective.
|Original language||English (US)|
|Title of host publication||Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|State||Published - Jun 18 2017|
|Event||54th Annual Design Automation Conference, DAC 2017 - Austin, United States|
Duration: Jun 18 2017 → Jun 22 2017
|Name||Proceedings - Design Automation Conference|
|Other||54th Annual Design Automation Conference, DAC 2017|
|Period||6/18/17 → 6/22/17|
Bibliographical noteFunding Information:
This research was supported in part by the National Science Foundation under grant number CNS-1441639 and the Semiconductor Research Corporation under contract number 2014- TS-2560.
© 2017 ACM.
- VDD and temperature variation
- XOR PUF
- challenge selection
- modeling attack
- response stability
- silicon data