Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements

Chen Zhou; Keshab K. Parhi; Chris H. Kim

doi:10.1145/3061639.3062315

Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements

Chen Zhou, Keshab K. Parhi, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

58 Scopus citations

Abstract

This paper shows that performing an XOR operation between the outputs of parallel arbiter PUFs generates a more secure output at the expense of reduced stability. In this work, we evaluate the security and stability of XOR PUFs using 1,000,000 randomly chosen challenges, applied to 10 custom-designed PUF chips, tested for 100,000 cycles per challenge, under different voltage and temperature conditions. Based on extensive hardware data, we propose a practical method for selecting challenges that will produce stable responses. A linear regression approach based on soft responses collected during enrollment phase was used to build accurate models for each individual arbiter PUF. Hardware data from fabricated chips verify that the approach is highly effective.

Original language	English (US)
Title of host publication	Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781450349277
DOIs	https://doi.org/10.1145/3061639.3062315
State	Published - Jun 18 2017
Event	54th Annual Design Automation Conference, DAC 2017 - Austin, United States Duration: Jun 18 2017 → Jun 22 2017

Publication series

Name	Proceedings - Design Automation Conference
Volume	Part 128280
ISSN (Print)	0738-100X

Other

Other	54th Annual Design Automation Conference, DAC 2017
Country/Territory	United States
City	Austin
Period	6/18/17 → 6/22/17

Bibliographical note

Publisher Copyright:
© 2017 ACM.

Keywords

VDD and temperature variation
XOR PUF
challenge selection
modeling attack
response stability
silicon data

Publisher link

10.1145/3061639.3062315

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Zhou, C., Parhi, K. K., & Kim, C. H. (2017). Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements. In Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017 Article 10 (Proceedings - Design Automation Conference; Vol. Part 128280). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/3061639.3062315

Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements. / Zhou, Chen; Parhi, Keshab K.; Kim, Chris H.
Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 10 (Proceedings - Design Automation Conference; Vol. Part 128280).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Zhou, C, Parhi, KK & Kim, CH 2017, Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements. in Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017., 10, Proceedings - Design Automation Conference, vol. Part 128280, Institute of Electrical and Electronics Engineers Inc., 54th Annual Design Automation Conference, DAC 2017, Austin, United States, 6/18/17. https://doi.org/10.1145/3061639.3062315

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title = "Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements",

abstract = "This paper shows that performing an XOR operation between the outputs of parallel arbiter PUFs generates a more secure output at the expense of reduced stability. In this work, we evaluate the security and stability of XOR PUFs using 1,000,000 randomly chosen challenges, applied to 10 custom-designed PUF chips, tested for 100,000 cycles per challenge, under different voltage and temperature conditions. Based on extensive hardware data, we propose a practical method for selecting challenges that will produce stable responses. A linear regression approach based on soft responses collected during enrollment phase was used to build accurate models for each individual arbiter PUF. Hardware data from fabricated chips verify that the approach is highly effective.",

keywords = "VDD and temperature variation, XOR PUF, challenge selection, modeling attack, response stability, silicon data",

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AB - This paper shows that performing an XOR operation between the outputs of parallel arbiter PUFs generates a more secure output at the expense of reduced stability. In this work, we evaluate the security and stability of XOR PUFs using 1,000,000 randomly chosen challenges, applied to 10 custom-designed PUF chips, tested for 100,000 cycles per challenge, under different voltage and temperature conditions. Based on extensive hardware data, we propose a practical method for selecting challenges that will produce stable responses. A linear regression approach based on soft responses collected during enrollment phase was used to build accurate models for each individual arbiter PUF. Hardware data from fabricated chips verify that the approach is highly effective.

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Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements

Abstract

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