SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers

Ramesh Harjani, Mike Chen, Marco Berkhout, Johan Vanderhaegan, Thomas H. Lee, Robert Bogdan Staszewski, Kathleen Philips, Howard C. Luong, Vadim Ivanov

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish (US)
Article number9365991
Pages (from-to)541-542
Number of pages2
JournalDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume64
DOIs
StatePublished - Feb 13 2021
Event2021 IEEE International Solid-State Circuits Conference, ISSCC 2021 - San Francisco, United States
Duration: Feb 13 2021Feb 22 2021

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Copyright 2021 Elsevier B.V., All rights reserved.

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