Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals

Yanfei Wu; Xinglong Ren; Kathryn A. Mcgarry; Matthew J. Bruzek; Christopher J. Douglas; C. Daniel Frisbie

doi:10.1002/aelm.201700117

Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals

Yanfei Wu, Xinglong Ren, Kathryn A. Mcgarry, Matthew J. Bruzek, Christopher J. Douglas, C. Daniel Frisbie

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Electronic disorder in organic semiconductor single crystals, manifested as parallel surface potential domains with potential variations ranging from tens to hundreds of mV, is observed by scanning Kelvin probe microscopy. Chemical etching and X-ray diffraction indicate that the potential domains are correlated with planar defects such as stacking faults. The results have important implications for understanding structure–transport relationships in organic semiconductor single crystals.

Original language	English (US)
Article number	1700117
Journal	Advanced Electronic Materials
Volume	3
Issue number	7
DOIs	https://doi.org/10.1002/aelm.201700117
State	Published - Jul 1 2017

Bibliographical note

Publisher Copyright:
© 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Keywords

Chemical etching
Organic single crystals
Planar defects
Scanning Kelvin probe microscopy
Surface potential

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title = "Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals",

abstract = "Electronic disorder in organic semiconductor single crystals, manifested as parallel surface potential domains with potential variations ranging from tens to hundreds of mV, is observed by scanning Kelvin probe microscopy. Chemical etching and X-ray diffraction indicate that the potential domains are correlated with planar defects such as stacking faults. The results have important implications for understanding structure–transport relationships in organic semiconductor single crystals.",

keywords = "Chemical etching, Organic single crystals, Planar defects, Scanning Kelvin probe microscopy, Surface potential",

author = "Yanfei Wu and Xinglong Ren and Mcgarry, {Kathryn A.} and Bruzek, {Matthew J.} and Douglas, {Christopher J.} and Frisbie, {C. Daniel}",

note = "Publisher Copyright: {\textcopyright} 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim",

year = "2017",

month = jul,

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doi = "10.1002/aelm.201700117",

language = "English (US)",

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T1 - Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals

AU - Wu, Yanfei

AU - Ren, Xinglong

AU - Mcgarry, Kathryn A.

AU - Bruzek, Matthew J.

AU - Douglas, Christopher J.

AU - Frisbie, C. Daniel

PY - 2017/7/1

Y1 - 2017/7/1

N2 - Electronic disorder in organic semiconductor single crystals, manifested as parallel surface potential domains with potential variations ranging from tens to hundreds of mV, is observed by scanning Kelvin probe microscopy. Chemical etching and X-ray diffraction indicate that the potential domains are correlated with planar defects such as stacking faults. The results have important implications for understanding structure–transport relationships in organic semiconductor single crystals.

AB - Electronic disorder in organic semiconductor single crystals, manifested as parallel surface potential domains with potential variations ranging from tens to hundreds of mV, is observed by scanning Kelvin probe microscopy. Chemical etching and X-ray diffraction indicate that the potential domains are correlated with planar defects such as stacking faults. The results have important implications for understanding structure–transport relationships in organic semiconductor single crystals.

KW - Chemical etching

KW - Organic single crystals

KW - Planar defects

KW - Scanning Kelvin probe microscopy

KW - Surface potential

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Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals

Abstract

Bibliographical note

Keywords

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MRSEC IRG-1: Electrostatic Control of Materials

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Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals

Abstract

Bibliographical note

Keywords

MRSEC Support

Publisher link

Find It

Other files and links

Fingerprint

Projects

MRSEC IRG-1: Electrostatic Control of Materials

University of Minnesota MRSEC (DMR-1420013)

Cite this