Abstract
A new method to perform scanning electrochemical microscopy (SECM) and topography simultaneously is described here. The new method uses a conventional scanning microelectrode to sense species released by local electrochemical reactions on the surface of a sample, combined with shear-force feedback to maintain the probe at a constant distance from the surface of the material. By using shear-force feedback, larger electrochemical currents can be detected at the microelectrode because the probe is scanned at a closer distance from the surface of the sample. The new method has yielded high lateral resolution topography and SECM images are reported here.
Original language | English (US) |
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Pages (from-to) | L64-L66 |
Journal | Journal of the Electrochemical Society |
Volume | 145 |
Issue number | 4 |
DOIs | |
State | Published - Apr 1998 |