Scanning auger investigation of commercial multifilamentary Nb3Sn conductors

D. B. Smathers, K. R. Marken, D. C. Larbalestier, J. Evans

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A Physical Electronics 595 Scanning Auger Microprobe was used to study etched filaments and transverse sections of variously reacted commercial bronze matrix multifilamentary Nb3Sn conductors. Using beams as fine as 100 nm, tfn concentration profiles were observed in polished samples. Differences were noted in the shape of the tin gradient as a function of the location of the reacted filaments with in the wires. The tin content of the bronze was also measured between pre-reacted filaments in an unreacted composite and found to be about 1 at.% lower than in the large bronze reservoirs. In a Harwell composite with P-poisoned niobium diffusion barriers, P was detectable in the Nb3Sn formed on the barrier but not on the filaments.

Original languageEnglish (US)
Pages (from-to)1421-1424
Number of pages4
JournalIEEE Transactions on Magnetics
Volume19
Issue number3
DOIs
StatePublished - May 1983

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Bronze
filaments
bronzes
Tin
conductors
Scanning
scanning
Niobium
tin
Diffusion barriers
Composite materials
composite materials
Electronic equipment
niobium
Wire
wire
gradients
matrices
profiles
electronics

Cite this

Scanning auger investigation of commercial multifilamentary Nb3Sn conductors. / Smathers, D. B.; Marken, K. R.; Larbalestier, D. C.; Evans, J.

In: IEEE Transactions on Magnetics, Vol. 19, No. 3, 05.1983, p. 1421-1424.

Research output: Contribution to journalArticle

Smathers, D. B. ; Marken, K. R. ; Larbalestier, D. C. ; Evans, J. / Scanning auger investigation of commercial multifilamentary Nb3Sn conductors. In: IEEE Transactions on Magnetics. 1983 ; Vol. 19, No. 3. pp. 1421-1424.
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