Scalable model for predicting the effect of negative bias temperature instability for reliable design

Keyphrases

• Negative Bias Temperature Instability 100%
• Reliable Design 100%
• Scalable Model 100%
• Read Delay 50%
• Model Accuracy 25%
• Predictive Models 25%
• Design Parameters 25%
• Ring Oscillator 25%
• Oxide Thickness 25%
• Threshold Voltage 25%
• Term Operation 25%
• Closed-form Expression 25%
• Delayed Degradation 25%
• Voltage Change 25%
• PMOS 25%
• Model Efficiency 25%
• Read Margin 25%
• Voltage Margin 25%
• Cycle Dynamics 25%
• Dynamic Operation 25%
• Hold Margin 25%
• Reaction-diffusion Mechanism 25%
• Data Retention Voltage 25%
• Transistor Parameters 25%

Computer Science

• Ring Oscillator 100%
• Model Accuracy 100%
• Data Retention 100%
• closed-form expression 100%
• Threshold Voltage 100%
• Predictive Model 100%
• Design Parameter 100%
• Oxide Thickness 100%

Engineering

• Negative bias temperature instability 100%
• Design Parameter 25%
• Metrics 25%
• Closed Form Expression 25%
• Oxide Thickness 25%
• Diffusion Mechanism 25%
• Read Voltage 25%
• Data Retention 25%
• Oscillator 25%