RTN induced frequency shift measurements using a ring oscillator based circuit

Qianying Tang, Xiaofei Wang, John Keane, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

The impact of random telegraph noise on ring oscillator (ROSC) frequency was measured for the first time using an on-chip beat frequency detection system. The proposed differential sensing scheme achieves a high frequency measurement resolution (>0.01%) at a short sampling time (>1μs) allowing efficient collection of RTN induced frequency shifts. Experimental data from a ROSC array fabricated in a 65nm LP process display both single trap and multi-trap RTN behavior. The voltage dependencies of the frequency shift and capture/emission times were measured and analyzed.

Original languageEnglish (US)
Title of host publication2013 Symposium on VLSI Technology, VLSIT 2013 - Digest of Technical Papers
PagesT188-T189
StatePublished - Sep 9 2013
Event2013 Symposium on VLSI Technology, VLSIT 2013 - Kyoto, Japan
Duration: Jun 11 2013Jun 13 2013

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
ISSN (Print)0743-1562

Other

Other2013 Symposium on VLSI Technology, VLSIT 2013
Country/TerritoryJapan
CityKyoto
Period6/11/136/13/13

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