Resonant x-ray scattering at the Se edge in liquid crystal free-standing films and devices

L. S. Matkin, H. F. Gleeson, P. Mach, C. C. Huang, R. Pindak, G. Srajer, J. Pollmann, J. W. Goodby, M. Hird, A. Seed

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Abstract

Resonant x-ray diffraction was carried out at the Se K edge in thick free-standing films of a selenophene liquid crystalline material, revealing detail of the structure of the ferro-, ferri-, and antiferroelectric phases. The ferrielectric phase was shown to have a three-layer superlattice. Moreover, the structure of a lower temperature hexatic phase was established. For the antiferroelectric phase, investigations were also carried out in a planar device configuration. The device allowed resonant scattering experiments to he carried out with and without the application of an electric field and resonant data are compared with electro-optic measurements carried out on the same device.

Original languageEnglish (US)
Pages (from-to)1863-1865
Number of pages3
JournalApplied Physics Letters
Volume76
Issue number14
DOIs
StatePublished - Apr 3 2000

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