Abstract
Bias temperature instability (BTI) induced delay shifts in a circuit depend strongly on its operating environment. While sensors can capture some operating parameters, they are ineffective in measuring vital performance shifts due to changes in the workloads and signal probabilities. This paper determines the delay of an aged circuit by amalgamating more frequent measurements on ring-oscillator sensors with infrequent online delay measurements on a monitored circuit to recalibrate the sensors. Our approach reduces the pessimism in predicting circuit delays, thus permitting lower delay guardbanding overheads compared to conventional methods.
| Original language | English (US) |
|---|---|
| Title of host publication | 2014 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014 - Digest of Technical Papers |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 492-497 |
| Number of pages | 6 |
| Edition | January |
| ISBN (Electronic) | 9781479962785 |
| DOIs | |
| State | Published - Jan 5 2015 |
| Event | 2014 33rd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014 - San Jose, United States Duration: Nov 2 2014 → Nov 6 2014 |
Publication series
| Name | IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD |
|---|---|
| Number | January |
| Volume | 2015-January |
| ISSN (Print) | 1092-3152 |
Other
| Other | 2014 33rd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014 |
|---|---|
| Country/Territory | United States |
| City | San Jose |
| Period | 11/2/14 → 11/6/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.
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