ReSCALE: Recalibrating sensor circuits for aging and lifetime estimation under BTI

Deepashree Sengupta, Sachin S. Sapatnekar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Bias temperature instability (BTI) induced delay shifts in a circuit depend strongly on its operating environment. While sensors can capture some operating parameters, they are ineffective in measuring vital performance shifts due to changes in the workloads and signal probabilities. This paper determines the delay of an aged circuit by amalgamating more frequent measurements on ring-oscillator sensors with infrequent online delay measurements on a monitored circuit to recalibrate the sensors. Our approach reduces the pessimism in predicting circuit delays, thus permitting lower delay guardbanding overheads compared to conventional methods.

Original languageEnglish (US)
Title of host publication2014 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014 - Digest of Technical Papers
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages492-497
Number of pages6
EditionJanuary
ISBN (Electronic)9781479962785
DOIs
StatePublished - Jan 5 2015
Event2014 33rd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014 - San Jose, United States
Duration: Nov 2 2014Nov 6 2014

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
NumberJanuary
Volume2015-January
ISSN (Print)1092-3152

Other

Other2014 33rd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014
Country/TerritoryUnited States
CitySan Jose
Period11/2/1411/6/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

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