Registration of CDL-111 and CDL-167 oat germplasm lines with pyramided adult plant crown rust resistance

Eric S. Nazareno, Roger Caspers, Melanie Caffe, Kevin Smith, Howard W. Rines, Shahryar F. Kianian

Research output: Contribution to journalArticlepeer-review

Abstract

Oat (Avena sativa L.) production worldwide is constrained by crown rust (caused by Puccinia coronata f. sp. avenae), which can cause significant yield losses. The disease is often controlled by spraying fungicides or planting resistant cultivars. Developing host resistance, however, is a challenge due to the high genetic variability of the pathogen. Race-specific resistance usually succumbs to new races in just a few years. As such, the USDA-ARS Cereal Disease Laboratory developed mapping populations to identify adult plant resistance (APR) loci from Avena sativa donors. Resistant lines from the mapping populations were selected and crossed with buckthorn (Rhamnus cathartica L.) nursery selection lines BT1020-1-1 and BT1021-1-1, which possess a different gene for crown rust resistance derived from Avena strigosa. From the crosses, CDL-111 (Reg. no. GP-122, PI 702639) and CDL-167 (Reg. no. GP-123, PI 702640), both containing three APR quantitative trait loci, were selected as germplasm for resistance breeding. High-throughput markers for selection were developed and implemented in pyramiding the APR loci.

Original languageEnglish (US)
Pages (from-to)410-414
Number of pages5
JournalJournal of Plant Registrations
Volume18
Issue number2
DOIs
StatePublished - May 2024

Bibliographical note

Publisher Copyright:
© 2024 The Authors. Journal of Plant Registrations published by Wiley Periodicals LLC on behalf of Crop Science Society of America. This article has been contributed to by U.S. Government employees and their work is in the public domain in the USA.

Fingerprint

Dive into the research topics of 'Registration of CDL-111 and CDL-167 oat germplasm lines with pyramided adult plant crown rust resistance'. Together they form a unique fingerprint.

Cite this