REFRACTIVE INDEX, THICKNESS, AND EXTINCTION COEFFICIENT OF SLIGHTLY ABSORBING THIN FILMS.

M. Ruiz-Urbieta, E. M. Sparrow

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Techniques are shown for successive determination of refractive index, thickness, and extinction coefficient of a slightly absorbing film deposited on a slightly absorbing or transparent substrate. The method is based on measurement of the Brewster angle for the film-substrate interface.

Original languageEnglish (US)
Pages (from-to)931-937
Number of pages7
JournalJ Opt Soc Am
Volume62
Issue number8
DOIs
StatePublished - Jan 1 1972

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