Abstract
Techniques are shown for successive determination of refractive index, thickness, and extinction coefficient of a slightly absorbing film deposited on a slightly absorbing or transparent substrate. The method is based on measurement of the Brewster angle for the film-substrate interface.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 931-937 |
| Number of pages | 7 |
| Journal | J Opt Soc Am |
| Volume | 62 |
| Issue number | 8 |
| DOIs | |
| State | Published - 1972 |