Keyphrases
Thermal Annealing
100%
Structural Evolution
100%
Organic Transistors
100%
Sum-frequency Generation Spectroscopy
75%
Polarization multiplexing
75%
Poly(3-hexylthiophene) (P3HT)
50%
Carrier Mobility
50%
Macromolecules
25%
Structural Change
25%
In Situ
25%
Dielectric Interface
25%
Field Effect
25%
Polymer Structure
25%
Differential Scanning Calorimetry
25%
Molecular Orientation
25%
Interfacial Structure
25%
Organic Dielectric
25%
Reorient
25%
Polymer Transistors
25%
Fluorocarbon
25%
Molecular Arrangement
25%
Silica Surface
25%
Bulk Properties
25%
Molecular Ordering
25%
Electrical Performance
25%
Surface Type
25%
Generation Study
25%
Bare Silica
25%
Kinetic Trapping
25%
Solution Casting
25%
Functionalized Silica
25%
Interfacial Parameters
25%
Linear Spectroscopy
25%
Bulk Measurements
25%
Material Science
Transistor
100%
Silicon Dioxide
100%
Annealing
100%
Carrier Mobility
100%
Film
50%
Differential Scanning Calorimetry
50%
Molecular Orientation
50%
Surface (Surface Science)
50%
Surface Type
50%
Thin Films
50%
Dielectric Material
50%
Engineering
Frequency Generation
100%
Silicon Dioxide
66%
Carrier Mobility
66%
Dielectrics
33%
Bulk Property
33%
Annealing Process
33%
Casting Solution
33%
Electrical Performance
33%
Thin Films
33%
Molecular Orientation
33%
Chemical Engineering
Film
100%
Fluorocarbon
50%
Differential Scanning Calorimetry
50%