Abstract
The slip correction parameter measured by Kim et al. (2005) is re-evaluated with the newly issued current smallest standard reference material SRM® 1964 (PSL 60.39nm). The same experimental method utilizing the electrical mobility technique under low pressure condition is used. From the measured peak voltages at low pressures down to 8.63kPa (Kn=81), slip correction factor (C) is calculated, and then the slip correction parameter (A) is obtained by nonlinear curve fitting. The parameter A is 1.165+0.480exp(-1.001/Kn) with the asymptotic value of 1.645 for the free molecular regime, which corresponds to a diffuse reflection fraction of 0.873. The value of A is at most 0.1% different from the value reported by Kim et al. (2005) 1.165+0.483exp(-0.997/Kn) and the uncertainty is reduced by about 0.5% to a value of about 1.5%.
Original language | English (US) |
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Pages (from-to) | 24-34 |
Number of pages | 11 |
Journal | Journal of Aerosol Science |
Volume | 51 |
DOIs | |
State | Published - Sep 2012 |
Bibliographical note
Funding Information:This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology ( 2011-0005408 ). The authors would like to thank HCT Ltd. for many technical supports for experimental set-up.
Keywords
- Drag force
- Electrical mobility
- Electrospray
- Free molecular regime
- Low pressure system
- Slip correction factor