Quantifying the impact of thickness and drain bias on black phosphorus field effect transistor performance

Nazila Haratipour, Steven J. Koester

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint Dive into the research topics of 'Quantifying the impact of thickness and drain bias on black phosphorus field effect transistor performance'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds