Barium ferrite films with high coercivity (>2000 Oe) have been prepared on single crystal sapphire substrates by laser in-situ deposition. The structures of these films were characterized by x-ray diffractometry. X-ray diffraction pattern shows a preferential c-axis orientation normal to the film plane at a high deposition temperature and a random orientation at a lower deposition temperature. The magnetic properties of the films were analyzed by a Vibrating Sample Magnetometer (VSM) and surface morphology was analyzed by an Atomic Force Microscope (AFM).
|Original language||English (US)|
|Number of pages||6|
|Journal||Materials Research Society Symposium - Proceedings|
|State||Published - Jan 1 1998|
|Event||Proceedings of the 1998 MRS Spring Meeting - San Francisco, CA, USA|
Duration: Apr 13 1998 → Apr 16 1998