Properties of electrophoretically deposited single wall carbon nanotube films

Junyoung Lim, Maryam Jalali, Stephen A. Campbell

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

This paper describes techniques for rapidly producing a carbon nanotube thin film by electrophoretic deposition at room temperature and determines the film mass density and electrical/mechanical properties of such films. The mechanism of electrophoretic deposition of thin layers is explained with experimental data. Also, film thickness is measured as a function of time, electrical field and suspension concentration. We use Rutherford backscattering spectroscopy to determine the film mass density. Films created in this manner have a resistivity of 2.14 × 10- 3 Ω·cm, a mass density that varies with thickness from 0.12 to 0.54 g/cm3, and a Young's modulus between 4.72 and 5.67 GPa. The latter was found to be independent of thickness from 77 to 134 nm. We also report on fabricating free-standing films by removing the metal seed layer under the CNT film, and selectively etching a sacrificial layer. This method could be extended to flexible photovoltaic devices or high frequency RF MEMS devices.

Original languageEnglish (US)
Pages (from-to)278-285
Number of pages8
JournalThin Solid Films
Volume589
DOIs
StatePublished - Aug 31 2015

Keywords

  • Carbon nanotube
  • Characterization
  • Electrophoretic deposition
  • RBS
  • Thin film

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