TY - JOUR
T1 - Process and reliability sensors for Nanoscale CMOS
AU - Keane, John P.
AU - Kim, Chris H.
AU - Liu, Qunzeng
AU - Sapatnekar, Sachin S
PY - 2012
Y1 - 2012
N2 - Some case studies describing the design of sensors to detect on-chip variations are studied. These sensors are designed to capture time-varying performance shifts due to aging phenomena based on ring oscillators (ROSC). A new class of on-chip reliability monitors called odometer has been demonstrated in silicon, targeted for a range of applications such as reliability characterization during process ramp up, chip lifetime projection, in-field product data collection, and real-time aging compensation. During the short measurement periods in odometer, a phase comparator uses a fresh reference ROSC to sample the output of an identical stressed ROSC. ROSCs can be either put into stress mode or kept fresh by switching the local power supply using power gates. A counter is used to measure the beat frequency by counting the number of reference ROSC periods during one period of the phase comparator output signal.
AB - Some case studies describing the design of sensors to detect on-chip variations are studied. These sensors are designed to capture time-varying performance shifts due to aging phenomena based on ring oscillators (ROSC). A new class of on-chip reliability monitors called odometer has been demonstrated in silicon, targeted for a range of applications such as reliability characterization during process ramp up, chip lifetime projection, in-field product data collection, and real-time aging compensation. During the short measurement periods in odometer, a phase comparator uses a fresh reference ROSC to sample the output of an identical stressed ROSC. ROSCs can be either put into stress mode or kept fresh by switching the local power supply using power gates. A counter is used to measure the beat frequency by counting the number of reference ROSC periods during one period of the phase comparator output signal.
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U2 - 10.1109/MDT.2012.2211561
DO - 10.1109/MDT.2012.2211561
M3 - Article
AN - SCOPUS:84873039107
SN - 0740-7475
VL - 29
SP - 8
EP - 17
JO - IEEE Design and Test of Computers
JF - IEEE Design and Test of Computers
IS - 5
M1 - 6266774
ER -