Probing millicharged particles at an electron beam dump with ultralow-threshold sensors

  • Rouven Essig
  • , Peiran Li
  • , Zhen Liu
  • , Megan McDuffie
  • , Ryan Plestid
  • , Hailin Xu

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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Physics

Material Science